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Nondestructive inspection of low atomic number media using inelastic photon scattering

✍ Scribed by J.M. Sharaf

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 298 KB
Volume: 65
Category: Article
ISSN: 0969-8043
DOI: 10.1016/j.apradiso.2007.07.003

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