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Nondestructive evaluation of solids and deposited films by thermal-wave interferometry

✍ Scribed by E. Oesterschulze; M. Stopka; M. Tochtrop-Mayr; K. Masseli; R. Kassing

Book ID
103616833
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
337 KB
Volume
69
Category
Article
ISSN
0169-4332

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An in situ, noncontact, photothermal displacement interferometer for performing thermal diffusivity measurements on bulk and thin-fihn materials has been developed. Localized transient surface motion is generated through photothermoelastic coupling of a pulsed, heating laser beam to the sample under