Nondestructive determination of electromagnetic parameters of dielectric materials at X-band frequencies using a waveguide probe system

Application of the FDTD method to determ

Application of the FDTD method to determine complex permittivity of dielectric materials at microwave frequencies using a rectangular waveguide

✍ Jaouad Terhzaz; Hassan Ammor; Abdelhadi Assir; Ahmed Mamouni 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 394 KB 👁 1 views

## Abstract A new measurement technique is presented to determine the complex permittivity of a dielectric material. The dielectric sample is loaded in a short‐circuited rectangular waveguide. The reflection coefficient of the waveguide is measured by Network analyzer and calculated as a function o