Noncontact Atomic Force Microscopy: Volume 3

✍ Scribed by Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger (eds.)

Publisher: Springer International Publishing
Year: 2015
Tongue: English
Leaves: 539
Series: NanoScience and Technology
Edition: 1
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

✦ Table of Contents

Front Matter....Pages i-xxii
Introduction....Pages 1-8
3D Force Field Spectroscopy....Pages 9-28
Simultaneous nc-AFM/STM Measurements with Atomic Resolution....Pages 29-49
Manipulation and Spectroscopy Using AFM/STM at Room Temperature....Pages 51-69
The Phantom Force....Pages 71-92
Non-contact Friction....Pages 93-110
Magnetic Exchange Force Spectroscopy....Pages 111-125
Revealing Subsurface Vibrational Modes by Atomic-Resolution Damping Force Spectroscopy....Pages 127-145
Self-assembly of Organic Molecules on Insulating Surfaces....Pages 147-171
Atomic-Scale Contrast Formation in AFM Images on Molecular Systems....Pages 173-194
Single Molecule Force Spectroscopy....Pages 195-222
Atomic Resolution on Molecules with Functionalized Tips....Pages 223-246
Mechanochemistry at Silicon Surfaces....Pages 247-274
Scanning Tunnelling Microscopy with Single Molecule Force Sensors....Pages 275-301
Nanostructured Surfaces of Doped Alkali Halides....Pages 303-326
The Atomic Structure of Two-Dimensional Silica....Pages 327-353
Imaging Molecules on Bulk Insulators Using Metallic Tips....Pages 355-378
Simulating Solid-Liquid Interfaces in Atomic Force Microscopy....Pages 379-409
Recent Progress in Frequency Modulation Atomic Force Microscopy in Liquids....Pages 411-433
Advanced Instrumentation of Frequency Modulation AFM for Subnanometer-Scale 2D/3D Measurements at Solid-Liquid Interfaces....Pages 435-460
Electrochemical Applications of Frequency Modulation Atomic Force Microscopy....Pages 461-479
High-Speed Atomic Force Microscopy....Pages 481-518
Back Matter....Pages 519-527

✦ Subjects

Nanoscale Science and Technology; Surfaces and Interfaces, Thin Films; Spectroscopy and Microscopy; Nanotechnology

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