Non-volatile memory cell design: Coupling ratio impact on tunnel oxide reliability

✍ Scribed by V. Bouquet; P. Canet; F. Lalande; R. Bouchakour; J.M. Mirabel

• Book ID: 116668595
• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 339 KB
• Volume: 351
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/j.jnoncrysol.2005.04.030