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Non-uniformities in ultra-thin oxide layers and their effect on the properties of tunnel MOS, MOM, and SOS devices

✍ Scribed by Bhatnagar, P. K. ;Dhariwal, S. R. ;Srivastava, G. P.


Publisher
John Wiley and Sons
Year
1981
Tongue
English
Weight
353 KB
Volume
67
Category
Article
ISSN
0031-8965

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