Non-linear analysis of the morphological evolution of void surfaces in metallic thin films under surface electromigration conditions

✍ Scribed by M.R. Gungor; Dimitrios Maroudas

• Book ID: 117218812
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 158 KB
• Volume: 415
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/s0039-6028(98)00565-2