Non-linear analog circuit fault diagnosis with large change sensitivity
✍ Scribed by Worsman, Matthew; Wong, Mike W. T.
- Book ID
- 101225296
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 213 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0098-9886
No coin nor oath required. For personal study only.
✦ Synopsis
Large change sensitivity has been proved e$cient at, but restricted to, generating a linear circuit fault dictionary. This paper discusses the extension of large change sensitivity to non-linear analog circuit fault diagnosis. The fault dictionary is divided into d.c. and a.c. sections. In the d.c. domain, non-linear components are approximated with piecewise linear models. By relating the operating region of each piecewise linear model to the magnitude of a single fault in a procedure termed preconditioning, it is shown that large change sensitivity can e$ciently compute the response of a faulty non-linear circuit. Results presented of an analysis of computational complexity show a signi"cant reduction in the cost of simulating single linear resistor faults in a non-linear circuit using this method. In addition, after establishing that the resistive portion of the circuit is fault free, a fault dictionary is constructed for dynamic components using large change sensitivity in the small signal a.c. domain. Included with a discussion on the issues of large change sensitivity based simulation-before-test, a small non-linear circuit is used to demonstrate the e!ectiveness of the proposed fault diagnosis algorithm.