Non-destructive tester for single event burnout of power diodes

✍ Scribed by G. Busatto; F. Iannuzzo; F. Velardi; J. Wyss

• Book ID: 118539793
• Publisher: Elsevier Science
• Year: 2001
• Tongue: English
• Weight: 335 KB
• Volume: 41
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(01)00211-6