Non-destructive technique to detect local buried defects in metal sample by scanning microwave microscopy

✍ Scribed by J. Rossignol; C. Plassard; E. Bourillot; O. Calonne; M. Foucault; E. Lesniewska

• Book ID: 119368245
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 886 KB
• Volume: 186
• Category: Article
• ISSN: 0924-4247
• DOI: 10.1016/j.sna.2012.06.027