✦ LIBER ✦
Non-destructive measurements for CMOS devices using charge-collection techniques : Edmonds, L.; Swift, G.; Johnston, A. IEEE Transactions on Nuclear Science, Vol. 43, No. 6, Part l, pp. 2833–2842 (1996)
- Publisher
- Elsevier Science
- Year
- 1998
- Tongue
- English
- Weight
- 135 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0963-8695
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