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Non-destructive measurement of the mobility in semiconductors by means of the microwave Faraday effect

✍ Scribed by J. Musil; F. Záček; A. Bürger; J. Karlovsky


Book ID
112566381
Publisher
Springer
Year
1976
Tongue
English
Weight
204 KB
Volume
26
Category
Article
ISSN
0011-4626

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