✦ LIBER ✦
Non-destructive lifetime measurement in silicon wafers by microwave reflection : J. M. Borrego, R. J. Gutman, N. Jensen and O. Paz. Solid-St. Electron.30 (2), 195 (1987)
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 124 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0026-2714
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