✦ LIBER ✦
Non-destructive depth information by inelastic XPS/AES background analysis, application to Cu2O growth investigations
✍ Scribed by S. Tougaard; W. Hetterich; A.H. Nielsen; H.S. Hansen
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 250 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0042-207X
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