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Non-destructive and quantitative analysis of buried interfaces of Si-related crystalline multilayers using high-energy ion scattering

✍ Scribed by T. Ito; E. Kamiya; J. Moon; A. Hiraki


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
295 KB
Volume
56-58
Category
Article
ISSN
0169-4332

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