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Noise spectral density measurements of a radiation hardened CMOS process in the weak and moderate inversion

✍ Scribed by Tedja, S.; Williams, H.H.; Van der Spiegel, J.; Newcomer, F.M.; Van Berg, R.

Book ID: 114554450
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 486 KB
Volume: 39
Category: Article
ISSN: 0018-9499
DOI: 10.1109/23.159711

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