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Noise methods of measuring the parameters of semiconductor materials and devices

✍ Scribed by N. B. Luk'yanchikova

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Spectroscopic methods for noise levels i

✍ N. B. Luk'yanchikova 📂 Article 📅 1990 🏛 Springer US 🌐 English ⚖ 485 KB

Methods and devices for measuring the pa

✍ V. A. Gavrikov; V. N. Azarov; K. A. Zhuravlev; A. I. Shitakov 📂 Article 📅 1991 🏛 Springer US 🌐 English ⚖ 385 KB

Apparatus for measuring the frequency ex

✍ V. F. Egorov; A. A. Kisurin; M. I. Shchevelev; A. N. Makovii 📂 Article 📅 1978 🏛 Springer US 🌐 English ⚖ 248 KB

Automatic measurement of galvanomagnetic

✍ V. V. Bespal'ko; A. R. Shelyag 📂 Article 📅 1991 🏛 Springer US 🌐 English ⚖ 213 KB

Measuring the noise factor of devices co

✍ B. S. Troitskii 📂 Article 📅 1984 🏛 Springer US 🌐 English ⚖ 287 KB

Rapid method of parameter measurement fo

✍ N. F. Vorob'ev 📂 Article 📅 1976 🏛 Springer US 🌐 English ⚖ 171 KB