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Noise measurements on photo avalanche diodes

✍ Scribed by Gong, J. ;van Vliet, K. M. ;Sutherland, A. D. ;Chenette, E. R.

Book ID: 105375171
Publisher: John Wiley and Sons
Year: 1981
Tongue: English
Weight: 855 KB
Volume: 63
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210630210

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