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Noise measurements of microwave transistors using an uncalibrated mechanical stub tuner and a built-in reverse six-port reflectometer

✍ Scribed by Di-Luan Le; Ghannouchi, F.M.


Book ID
114543242
Publisher
IEEE
Year
1995
Tongue
English
Weight
477 KB
Volume
44
Category
Article
ISSN
0018-9456

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