Noise characteristics of an ideal shunted Josephson junction

✍ Scribed by Richard F. Voss

• Book ID: 104627004
• Publisher: Springer US
• Year: 1981
• Tongue: English
• Weight: 520 KB
• Volume: 42
• Category: Article
• ISSN: 0022-2291
• DOI: 10.1007/bf00116701

✦ Synopsis

Detailed computer simulations have been made of the effect of intrinsic noise current on the I-V characteristic and voltage noise spectral density Sv(f) of an Meal Josephson element shuntgd by a capacitor and resistor. The minimum value of the parameter tic at which hysteresis appears in the quasistatic I-V characteristic is greater than the noise-free value of -~1. Moreover, as [3~ is increased, a region of large differential resistance Rd appears in the I-V characteristic that is associated with a large increase in Sv(0). In this regime the noise current is seen to cause random switching between the superconducting and nonzero voltage states. For all bias conditions, Sv(f) > R~SI(f) where Si(f) is the spectral density of the intrinsic current noise. A comparison is made between these results and previous calculations. The implications for low-noise superconducting devices are discussed.