Noise and lifetime measurements in Si p+-i-n power diodes: P. Fang, L. He, A. D. Van Rheenen, A. van der Ziel and Q. Peng. Solid-St. Electron. 32(5), 345 (1989)

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 127 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90449-w