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Node Switching Rates of Opportunistic Relaying and Switch-and-Examine Relaying in Rician and Nakagami-m Fading

✍ Scribed by Chuzhe Xiao; Beaulieu, N.C.


Book ID
114612978
Publisher
IEEE
Year
2012
Tongue
English
Weight
378 KB
Volume
60
Category
Article
ISSN
0090-6778

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