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NMR/ON of206Bi implanted at T < 0.2 K and at room temperature into nickel

✍ Scribed by P. Herzog; U. Dämmrich; K. Freitag; C. -D. Herrmann; K. Schlösser

Book ID
112683347
Publisher
Springer
Year
1985
Tongue
English
Weight
191 KB
Volume
22
Category
Article
ISSN
0304-3843

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✍ M.J. Soares; J.P. Leitão; M.I.N. da Silva; J.C. González; F.M. Matinaga; K. Lore 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 703 KB

In this work erbium ions were implanted into AlN films grown on sapphire with fluence range: (0.5-2) Â 10 15 at/cm À2 , ion energy range: 150-350 keV and tilt angle: 0°, 10°, 20°, 30°. The optical and structural properties of the films are studied by means of photoluminescence and Raman spectroscopy