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Nitrogen profiling in nitride films and nitrogen-implanted samples using the 14N(α, α) and14N(α, p) reactions at 6 MeV incident energy

✍ Scribed by H. Artigalas; A. Chevarier; N. Chevarier; M. El Bouanani; E. Gerlic; N. Moncoffre; B. Roux; M. Stern; J. Tousset

No coin nor oath required. For personal study only.

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