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NIST NSLS-II spectroscopy beamline optical plan for soft and tender X-ray spectroscopy and microscopy (100 eV to 7.5 keV)

✍ Scribed by R. Reininger; J.C. Woicik; S.L. Hulbert; D.A. Fischer


Book ID
113821797
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
326 KB
Volume
649
Category
Article
ISSN
0168-9002

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