NiO as a test case for high resolution resonant inelastic soft x-ray scattering

✍ Scribed by Ghiringhelli, G; Matsubara, M; Dallera, C; Fracassi, F; Gusmeroli, R; Piazzalunga, A; Tagliaferri, A; Brookes, N B; Kotani, A; Braicovich, L

• Book ID: 120546370
• Publisher: Institute of Physics
• Year: 2005
• Tongue: English
• Weight: 873 KB
• Volume: 17
• Category: Article
• ISSN: 0953-8984
• DOI: 10.1088/0953-8984/17/35/007