✦ LIBER ✦
Nickel-related deep levels in silicon studied by combined hall effect and DLTS measurement
✍ Scribed by Kitagawa, H. ;Nakashima, H.
- Publisher
- John Wiley and Sons
- Year
- 1987
- Tongue
- English
- Weight
- 200 KB
- Volume
- 99
- Category
- Article
- ISSN
- 0031-8965
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