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Newly developed novolak-based resist materials for ion projection lithography (IPL) with structure dimensions of 200-100 nanometers

✍ Scribed by G. Stangl; E. Cekan; Ch. Eckes; W. Friza; F. Thalinger; A. Bruckner; P. Hudek; W. Fallmann


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
506 KB
Volume
21
Category
Article
ISSN
0167-9317

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