An easy to fabricate and versatile cell that can be used with a variety of electrochemical techniques, also meeting the stringent requirement for undertaking cyclic voltammetry under transient conditions in in situ electrocrystallization studies and total external reflection X-ray analysis, has been
New transient characterization of latchup phenomenon in CMOS cell
โ Scribed by F.M. Roche; S.D. Bocus; P. Girard; R. Barille
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 226 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0167-9317
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