## Abstract In the electron microscope, spectroscopic signals such as the characteristic Xβrays or the energy loss of the incident beam can provide an analysis of the local composition or electronic structure. Recent improvements in the energy resolution and sensitivity of electron spectrometers ha
New techniques in electron energy-loss spectroscopy and energy-filtered imaging
β Scribed by R.F. Egerton
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 279 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0968-4328
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β¦ Synopsis
This article is a survey of hardware and software advances that promise to increase the power and sensitivity of electron energy-loss spectroscopy (EELS) and energy-filtered imaging (EFTEM) in a transmission electron microscope. Recent developments include electron-gun monochromators, lens-aberration correctors, and software for spectral sharpening, spectral processing and interpretation of fine structure. Future improvements could include the deployment of new electron sources. The expected enhancements in energy and spatial resolution are compared with fundamental limitations that arise from the natural widths of spectral peaks, the delocalization of inelastic scattering and the problem of electron-irradiation damage.
π SIMILAR VOLUMES
Energy-filtered electron imaging is one of the future directions of high-resolution electron microscopy (HREM). In this paper, characteristics and applications of energy-selected HREM are illustrated. Image contrast can be dramatically improved with the use of an energy filter. High-resolution chemi