New technique to measure the polarization dependence of non-resonant X-ray magnetic scattering

✍ Scribed by H Ohsumi; M Mizumaki; S Kimura; M Takata; H Suematsu

• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 205 KB
• Volume: 345
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/j.physb.2003.11.068

✦ Synopsis

A new technique to measure the polarization dependence of scattering intensity without using an analyzer crystal has been developed and applied to a magnetic satellite reflection of rare-earth metal dysprosium. We have successfully observed the scattering plane inclination angle W dependence of satellite peak intensity. The magnetic and charge scattering have definitely different W dependence of scattering intensity, which enables us to distinguish the scattering origins.