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✦ LIBER ✦

New Short-Circuit Testing Facilities to Cope With the Recent Development of GIS

✍ Scribed by Yamamoto, M.; Yamashita, S.; Ikeda, H.; Yanabu, S.

Book ID: 117899938
Publisher: IEEE
Year: 1985
Tongue: English
Weight: 339 KB
Volume: PER-5
Category: Article
ISSN: 0272-1724
DOI: 10.1109/mper.1985.5528561

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