New positive charge trapping dynamics in SiO2 gate oxide, based on bulk impact ionization processes under Fowler–Nordheim stress

✍ Scribed by Piyas Samanta; C.K. Sarkar

• Book ID: 108362362
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 262 KB
• Volume: 38
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(98)00055-9