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New method of determining Fourier coefficients of crystal potential from thickness fringes in electron micrographs

โœ Scribed by Ichimiya, A. ;Arii, T. ;Uyeda, R. ;Fukuhara, A.


Book ID
114521546
Publisher
International Union of Crystallography
Year
1973
Weight
226 KB
Volume
29
Category
Article
ISSN
0567-7394

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