✦ LIBER ✦
New method for the preparation of S doped Fe samples characterized by AES and TOF-SIMS depth profiling
✍ Scribed by Barnard, P. E.; Terblans, J. J.; Swart, H. C.
- Book ID
- 126875132
- Publisher
- John Wiley and Sons
- Year
- 2014
- Tongue
- English
- Weight
- 743 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0142-2421
- DOI
- 10.1002/sia.5448
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