New method for absorption correction in high-accuracy, quantitative EDX microanalysis in the TEM including low-energy x-ray lines

✍ Scribed by O. Eibl

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 870 KB
• Volume: 50
• Category: Article
• ISSN: 0304-3991
• DOI: 10.1016/0304-3991(93)90008-l