New measurement technique for the product of the electron mobility and mean free drift time for pixelated semiconductor detectors

✍ Scribed by Yvan A. Boucher; Feng Zhang; Willy Kaye; Zhong He

• Book ID: 113822358
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 861 KB
• Volume: 671
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2011.12.008