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New measurement system for fault location in optical waveguide devices based on an interferometric technique

✍ Scribed by Takada, Kazumasa ;Yokohama, Itaru ;Chida, Kazumori ;Noda, Juichi


Book ID
115334958
Publisher
The Optical Society
Year
1987
Tongue
English
Weight
524 KB
Volume
26
Category
Article
ISSN
1559-128X

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