New Materials in Memory Development Sub 50 nm: Trends in Flash and DRAM

✍ Scribed by Karl Heinz Kuesters; Marc Florian Beug; Uwe Schroeder; Nicolas Nagel; Ulrike Bewersdorff; Gerald Dallmann; Stefan Jakschik; Roman Knoefler; Stephan Kudelka; Christoph Ludwig; Dirk Manger; Wolfgang Mueller; Armin Tilke

• Publisher: John Wiley and Sons
• Year: 2009
• Tongue: English
• Weight: 78 KB
• Volume: 11
• Category: Article
• ISSN: 1438-1656
• DOI: 10.1002/adem.200990017