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New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors

✍ Scribed by Sadewasser, Sascha; Jelinek, Pavel; Fang, Chung-Kai; Custance, Oscar; Yamada, Yusaku; Sugimoto, Yoshiaki; Abe, Masayuki; Morita, Seizo


Book ID
118261786
Publisher
The American Physical Society
Year
2009
Tongue
English
Weight
761 KB
Volume
103
Category
Article
ISSN
0031-9007

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