✦ LIBER ✦
New Insight Into PBTI Evaluation Method for nMOSFETs With Stacked High- $k$/IL Gate Dielectric
✍ Scribed by Lee, Sang Kyung; Jo, Minseok; Sohn, Chang-Woo; Kang, Chang Yong; Lee, Jack C.; Jeong, Yoon-Ha; Lee, Byoung Hun
- Book ID
- 120077550
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 729 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0741-3106
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