✦ LIBER ✦
New filler-induced failure mechanism in plastic encapsulated VLSI dynamic MOS memories : H. Matsumoto, M. Yamada, J. Fukushima, T. Kondoh, N. Kotani and M. Tosa. 23 a. Proc. Reliab. Phys. Symp. 180 (1985)
- Publisher
- Elsevier Science
- Year
- 1986
- Tongue
- English
- Weight
- 96 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0026-2714
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