New fault models and efficient BIST algorithms for dual-port memories

✍ Scribed by Amin, A.A.; Osman, M.Y.; Abdel-Aal, R.E.; Al-Muhtaseb, H.

• Book ID: 119778228
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 380 KB
• Volume: 16
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/43.658567