Ion beam-treated silicon probes operated
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Dziomba, Th.; Sulzbach, Th.; Ohlsson, O.; Lehrer, Ch.; Frey, L.; Danzebrink, H.
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Article
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1999
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John Wiley and Sons
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English
⚖ 287 KB
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We present aperture probes based on non-contact silicon atomic force microscopy (AFM) cantilevers for simultaneous AFM and near-infrared scanning near-Ðeld optical microscopy (SNOM). For use in high-resolution near-Ðeld optical microscopy, conventional AFM cantilevers are modiÐed by covering their t