New data-processing technique for measurement of metallic foil thickness with differential white-light interferometry

✍ Scribed by Yanli Du; Huimin Yan; Yongjun Nie; Xiuda Zhang; Minmin Zheng

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 181 KB
• Volume: 45
• Category: Article
• ISSN: 0143-8166
• DOI: 10.1016/j.optlaseng.2006.03.007