New carbon nanotube AFM probe technology
β Scribed by Ramsey M. Stevens
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 465 KB
- Volume
- 12
- Category
- Article
- ISSN
- 1369-7021
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A simple and reliable welding method was developed to fabricate carbon nanotube probe used in atomic force microscopy here. First, apply less than 20 V voltage between silicon probe and carbon nanotube when they were in close proximity under direct view of optical microscope. Then, let carbon nanotu
Multi-wall carbon nanotubes (MWNTs) deposited on various substrates were analysed by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). A dispersion of carbon nanotubes in ethanol was drawn through a 200 nm pore ceramic filter to produce a thin film of nanotubes. This film was br