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New bit-error-rate monitoring technique based on histograms and curve fitting

✍ Scribed by Ding, Lei; Zhong, Wen-De; Lu, Chao; Wang, Yixin

Book ID: 115404248
Publisher: Optical Society of America
Year: 2004
Tongue: English
Weight: 85 KB
Volume: 12
Category: Article
ISSN: 1094-4087
DOI: 10.1364/OPEX.12.002507

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