In this work we introduce a molecular beam epitaxy (MBE)-grown InAs layer as base in ballistic electron emission spectroscopy/microscopy (BEES/BEEM). Compared to the commonly used thin metal Γlm as base, the transmission coefficient and the attenuation length can be enhanced by more than one order o
New ballistic electron emission microscopy system for surface and interface analysis
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 148 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0042-207X
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