✦ LIBER ✦
New aspects and mechanism of kink effect in static back-gate transconductance characteristics in fully-depleted SOI MOSFETs on high-dose SIMOX wafers
✍ Scribed by Ushiki, T.; Kotani, K.; Funaki, T.; Kawai, K.; Ohmi, T.
- Book ID
- 114538034
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 190 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.