New approaches to failure analysis using XPS sputter-depth profiles

✍ Scribed by G. D. Davis; H. M. Clearfield; W. C. Moshier; G. O. Cote

• Publisher: John Wiley and Sons
• Year: 1988
• Tongue: English
• Weight: 506 KB
• Volume: 11
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/sia.740110615